TY  - RPRT
TI  - Investigation of Q degradation in low-loss Si3N4 from heterogeneous laser integration
AU  - Joel Guo
AU  - Chao Xiang
AU  - Warren Jin
AU  - Jonathan Peters
AU  - Mingxiao Li
AU  - Theodore Morin
AU  - Yu Xia
AU  - John E. Bowers
PY  - 2024
UR  - https://arxiv.org/abs/2406.09533
ID  - 2406.09533
ER  -