@misc{indiciae554ba9c40ae8,
  title = {Relative Time-of-Flight Measurement in an Ultrafast Electron Microscope},
  author = {Jialiang Chen and Simon A. Willis and David J. Flannigan},
  year = {2024},
  doi = {10.1063/5.0222993},
  url = {https://arxiv.org/abs/2406.13614},
  note = {Source identifier: 2406.13614}
}