@misc{indiciae951216bfd892,
  title = {Magnetic Force Microscopy: High Quality-Factor Two-Pass Mode},
  author = {Christopher Habenschaden and Sibylle Sievers and Alexander Klasen and Andrea Cerreta and Hans Werner Schumacher},
  year = {2024},
  doi = {10.1063/5.0226633},
  url = {https://arxiv.org/abs/2406.17664},
  note = {Source identifier: 2406.17664}
}