@misc{indiciaec6063cf3c8b0,
  title = {Multiparameter admittance spectroscopy for investigating defects in MoS\$\{\_2\}\$ thin film MOSFETs},
  author = {Eros Reato and Ardeshir Esteki and Benny Ku and Zhenxing Wang and Michael Heuken and Max C. Lemme and Olof Engström},
  year = {2024},
  doi = {10.1109/ted.2025.3527413},
  url = {https://arxiv.org/abs/2407.07783},
  note = {Source identifier: 2407.07783}
}