TY  - RPRT
TI  - Revisiting the Formulation of Charged Defect in Solids
AU  - Hanzhi Shang
AU  - Zeyu Jiang
AU  - Yiyang Sun
AU  - Damien West
AU  - Shengbai Zhang
PY  - 2024
UR  - https://arxiv.org/abs/2407.08504
ID  - 2407.08504
ER  -