@misc{indiciaee474249eb6fa,
  title = {An Evaluation of Continual Learning for Advanced Node Semiconductor Defect Inspection},
  author = {Amit Prasad and Bappaditya Dey and Victor Blanco and Sandip Halder},
  year = {2024},
  url = {https://arxiv.org/abs/2407.12724},
  note = {Source identifier: 2407.12724}
}