@misc{indiciae8f6dabe46cab,
  title = {Complementary two dimensional carrier profiles of 4H-SiC MOSFETs by Scanning Spreading Resistance Microscopy and Scanning Capacitance Microscopy},
  author = {Patrick Fiorenza and Marco Zignale and Edoardo. Zanetti and Mario S. Alessandrino and Beatrice Carbone and Alfio Guarnera and Mario Saggio and Filippo Giannazzo and Fabrizio Roccaforte},
  year = {2024},
  url = {https://arxiv.org/abs/2407.13370},
  note = {Source identifier: 2407.13370}
}