TY  - RPRT
TI  - High-dimensional log contrast models with measurement errors
AU  - Wenxi Tan
AU  - Lingzhou Xue
AU  - Songshan Yang
AU  - Xiang Zhan
PY  - 2024
UR  - https://arxiv.org/abs/2407.15084
ID  - 2407.15084
ER  -