@misc{indiciaeca5049d09c51,
  title = {YOLO-pdd: A Novel Multi-scale PCB Defect Detection Method Using Deep Representations with Sequential Images},
  author = {Bowen Liu and Dongjie Chen and Xiao Qi},
  year = {2024},
  url = {https://arxiv.org/abs/2407.15427},
  note = {Source identifier: 2407.15427}
}