TY  - RPRT
TI  - Analysis of Scalable Anomalous Reflectors through Ray Tracing and Measurements
AU  - Le Hao
AU  - Sravan K. R. Vuyyuru
AU  - Sergei A. Tretyakov
AU  - Markus Rupp
AU  - Risto Valkonen
PY  - 2024
UR  - https://arxiv.org/abs/2407.17279
ID  - 2407.17279
ER  -