TY  - RPRT
TI  - Utilizing Generative Adversarial Networks for Image Data Augmentation and Classification of Semiconductor Wafer Dicing Induced Defects
AU  - Zhining Hu
AU  - Tobias Schlosser
AU  - Michael Friedrich
AU  - André Luiz Vieira e Silva
AU  - Frederik Beuth
AU  - Danny Kowerko
PY  - 2024
UR  - https://arxiv.org/abs/2407.20268
ID  - 2407.20268
ER  -