TY  - RPRT
TI  - Invariant Discovery of Features Across Multiple Length Scales: Applications in Microscopy and Autonomous Materials Characterization
AU  - Aditya Raghavan
AU  - Utkarsh Pratiush
AU  - Mani Valleti
AU  - Richard Liu
AU  - Reece Emery
AU  - Hiroshi Funakubo
AU  - Yongtao Liu
AU  - Philip Rack
AU  - Sergei Kalinin
PY  - 2024
UR  - https://arxiv.org/abs/2408.00229
ID  - 2408.00229
ER  -