@misc{indiciaeb02b166c7097,
  title = {Stacking fault segregation imaging with analytical field ion microscopy},
  author = {F. F. Morgado and L. T. Stephenson and S. Bhatt and C. Freysoldt and S. Neumeier and S. Katnagallu and A. P. A. Subramanyam and I. Pietka and T. Hammerschmidt and F. Vurpillot and B. Gault},
  year = {2024},
  url = {https://arxiv.org/abs/2408.03167},
  note = {Source identifier: 2408.03167}
}