TY  - RPRT
TI  - Probing electron trapping by current collapse in GaN/AlGaN FETs utilizing quantum transport characteristics
AU  - Takaya Abe
AU  - Motoya Shinozaki
AU  - Kazuma Matsumura
AU  - Takumi Aizawa
AU  - Takeshi Kumasaka
AU  - Norikazu Ito
AU  - Taketoshi Tanaka
AU  - Ken Nakahara
AU  - Tomohiro Otsuka
PY  - 2024
DO  - 10.1063/5.0232463
UR  - https://arxiv.org/abs/2408.04109
ID  - 2408.04109
ER  -