@misc{indiciae7a2b15fdb53e,
  title = {Spontaneous damage annealing reactions as a possible source of low energy excess in semiconductor detectors},
  author = {Kai Nordlund and Fanhao Kong and Flyura Djurabekova and Matti Heikinheimo and Kimmo Tuominen and Nader Mirabolfathi and Antti Kuronen},
  year = {2025},
  doi = {10.1103/p7s5-4qjw},
  url = {https://arxiv.org/abs/2408.07518},
  note = {Source identifier: 2408.07518}
}