TY  - RPRT
TI  - Spontaneous damage annealing reactions as a possible source of low energy excess in semiconductor detectors
AU  - Kai Nordlund
AU  - Fanhao Kong
AU  - Flyura Djurabekova
AU  - Matti Heikinheimo
AU  - Kimmo Tuominen
AU  - Nader Mirabolfathi
AU  - Antti Kuronen
PY  - 2025
DO  - 10.1103/p7s5-4qjw
UR  - https://arxiv.org/abs/2408.07518
ID  - 2408.07518
ER  -