@misc{indiciaee23dfeb9aefb,
  title = {Dielectric Reliability and Interface Trap Characterization in MOCVD grown In-situ Al\$\_2\$O\$\_3\$ on \$β\$-Ga\$\_2\$O\$\_3\$},
  author = {Saurav Roy and Arkka Bhattacharyya and Carl Peterson and Sriram Krishnamoorthy},
  year = {2024},
  url = {https://arxiv.org/abs/2408.11342},
  note = {Source identifier: 2408.11342}
}