TY  - RPRT
TI  - Dielectric Reliability and Interface Trap Characterization in MOCVD grown In-situ Al$_2$O$_3$ on $β$-Ga$_2$O$_3$
AU  - Saurav Roy
AU  - Arkka Bhattacharyya
AU  - Carl Peterson
AU  - Sriram Krishnamoorthy
PY  - 2024
UR  - https://arxiv.org/abs/2408.11342
ID  - 2408.11342
ER  -