@misc{indiciae725b0ec921e1,
  title = {Preventing overfitting in infrared ellipsometry using temperature dependence: fused silica as a case study},
  author = {Shenwei Yin and Jin-Woo Cho and Demeng Feng and Hongyan Mei and Tanuj Kumar and Chenghao Wan and Yeonghoon Jin and Minjeong Kim and Mikhail A. Kats},
  year = {2025},
  url = {https://arxiv.org/abs/2409.05323},
  note = {Source identifier: 2409.05323}
}