@misc{indiciae4ca08919a41f,
  title = {Quantifying Implantation Induced Damage and Point Defects with Multislice Electron Ptychography},
  author = {Junghwa Kim and Colin Gilgenbach and Aaditya Bhat and James LeBeau},
  year = {2025},
  url = {https://arxiv.org/abs/2409.06987},
  note = {Source identifier: 2409.06987}
}