TY  - RPRT
TI  - Quantifying Implantation Induced Damage and Point Defects with Multislice Electron Ptychography
AU  - Junghwa Kim
AU  - Colin Gilgenbach
AU  - Aaditya Bhat
AU  - James LeBeau
PY  - 2025
UR  - https://arxiv.org/abs/2409.06987
ID  - 2409.06987
ER  -