TY  - RPRT
TI  - Characterisation of analogue MAPS fabricated in 65 nm technology for the ALICE ITS3
AU  - Kunal Gautam
AU  - Ajit Kumar
PY  - 2024
DO  - 10.1016/j.nima.2024.169787
UR  - https://arxiv.org/abs/2409.07543
ID  - 2409.07543
ER  -