@misc{indiciae4a9867fd5e7c,
  title = {Sensitivity of Multislice Electron Ptychography to Point Defects: A Case Study in SiC},
  author = {Aaditya Bhat and Colin Gilgenbach and Junghwa Kim and Michael Xu and Menglin Zhu and James M. LeBeau},
  year = {2025},
  url = {https://arxiv.org/abs/2409.07663},
  note = {Source identifier: 2409.07663}
}