TY  - RPRT
TI  - Sensitivity of Multislice Electron Ptychography to Point Defects: A Case Study in SiC
AU  - Aaditya Bhat
AU  - Colin Gilgenbach
AU  - Junghwa Kim
AU  - Michael Xu
AU  - Menglin Zhu
AU  - James M. LeBeau
PY  - 2025
UR  - https://arxiv.org/abs/2409.07663
ID  - 2409.07663
ER  -