TY  - RPRT
TI  - Ab Initio Device-Driven Screening of Sub-1-nm Thickness Oxide Semiconductors for Future CMOS Technology Nodes
AU  - Linqiang Xu
AU  - Yue Hu
AU  - Lianqiang Xu
AU  - Lin Xu
AU  - Qiuhui Li
AU  - Aili Wang
AU  - Chit Siong Lau
AU  - Jing Lu
AU  - Yee Sin Ang
PY  - 2024
UR  - https://arxiv.org/abs/2409.08096
ID  - 2409.08096
ER  -