TY  - RPRT
TI  - Size Effect on Raman Measured Stress and Strain Induced Phonon Shifts in Ultra-Thin Film Silicon
AU  - Christopher Pashartis
AU  - Michiel J. van Setten
AU  - Geoffrey Pourtois
PY  - 2024
DO  - 10.1063/5.0240392
UR  - https://arxiv.org/abs/2409.16188
ID  - 2409.16188
ER  -