@misc{indiciaea940c92951d4,
  title = {Measuring vacancy-type defect density in monolayer semiconductors},
  author = {Aleksandar Radic and Nick von Jeinsen and Vivian Perez and Ke Wang and Min Lin and Boyao Liu and Yiru Zhu and Ismail Sami and Kenji Watanabe and Takashi Taniguchi and David Ward and Andrew Jardine and Akshay Rao and Manish Chhowalla and Sam Lambrick},
  year = {2026},
  url = {https://arxiv.org/abs/2409.18637},
  note = {Source identifier: 2409.18637}
}