@misc{indiciae984b9de635bf,
  title = {Tracking solid oxide cell electrode microstructural evolution during annealing by scanning 3D X-ray diffraction microscopy},
  author = {A. Shukla and S. De Angelis and J. Wright and Y. Zhang and J. Oddershede and H. F. Poulsen and J. W. Andreasen},
  year = {2024},
  url = {https://arxiv.org/abs/2410.10671},
  note = {Source identifier: 2410.10671}
}