TY  - RPRT
TI  - Tracking solid oxide cell electrode microstructural evolution during annealing by scanning 3D X-ray diffraction microscopy
AU  - A. Shukla
AU  - S. De Angelis
AU  - J. Wright
AU  - Y. Zhang
AU  - J. Oddershede
AU  - H. F. Poulsen
AU  - J. W. Andreasen
PY  - 2024
UR  - https://arxiv.org/abs/2410.10671
ID  - 2410.10671
ER  -