TY  - RPRT
TI  - Doping-induced evolution of the intrinsic hump and dip energies dependent on the sample fabrication conditions in Bi$_2$Sr$_2$CaCu$_2$O$_{8+δ}$
AU  - Tatsuya Honma
PY  - 2026
DO  - 10.1142/s0217979226500578
UR  - https://arxiv.org/abs/2410.11258
ID  - 2410.11258
ER  -