TY  - RPRT
TI  - Mechanism of $E'_γ$ Defect Generation in Ionizing-irradiated $a$-SiO$_2$: The Nonradiative Carrier Capture-Structural Relaxation Model
AU  - Yu Song
AU  - Chen Qiu
AU  - Su-Huai Wei
PY  - 2025
DO  - 10.1103/9y5y-61ps
UR  - https://arxiv.org/abs/2410.11475
ID  - 2410.11475
ER  -