TY  - RPRT
TI  - On the Influence of Parallax Effects in Thick Silicon Sensors in Coherent Diffraction Imaging
AU  - Markus Kuster
AU  - Robert Hartmann
AU  - Steffen Hauf
AU  - Peter Holl
AU  - Tonn Rüter
AU  - Lothar Strüder
PY  - 2025
UR  - https://arxiv.org/abs/2410.14474
ID  - 2410.14474
ER  -