@misc{indiciae461f800bf957,
  title = {Measuring error rates of mid-circuit measurements},
  author = {Daniel Hothem and Jordan Hines and Charles Baldwin and Dan Gresh and Robin Blume-Kohout and Timothy Proctor},
  year = {2024},
  url = {https://arxiv.org/abs/2410.16706},
  note = {Source identifier: 2410.16706}
}