@misc{indiciaed8477623c308,
  title = {Direct measurement of 2DEG states in shallow Si:Sb \$δ\$-layers},
  author = {Frode S. Strand and Simon P. Cooil and Quinn T. Campbell and John J. Flounders and Håkon I. Røst and Anna Cecilie Åsland and Alv Johan Skarpeid and Marte P. Stalsberg and Jinbang Hu and Johannes Bakkelund and Victoria Bjelland and Alexei B. Preobrajenski and Zheshen Li and Marco Bianchi and Jill A. Miwa and Justin W. Wells},
  year = {2024},
  doi = {10.1021/acs.jpcc.4c07331},
  url = {https://arxiv.org/abs/2410.17387},
  note = {Source identifier: 2410.17387}
}