@misc{indiciae1577d5ec6907,
  title = {Statistical Analysis of Spurious Dot Formation in SiMOS Single Electron Transistors},
  author = {Kuan-Chu Chen and Clement Godfrin and George Simion and Imri Fattal and Stefan Kubicek and Sofie Beyne and Bart Raes and Arne Loenders and Kuo-Hsing Kao and Danny Wan and Kristiaan De Greve},
  year = {2024},
  url = {https://arxiv.org/abs/2410.18546},
  note = {Source identifier: 2410.18546}
}