TY  - RPRT
TI  - Enhancing Apple's Defect Classification: Insights from Visible Spectrum and Narrow Spectral Band Imaging
AU  - Omar Coello
AU  - Moisés Coronel
AU  - Darío Carpio
AU  - Boris Vintimilla
AU  - Luis Chuquimarca
PY  - 2024
DO  - 10.1109/icprs62101.2024.10677803
UR  - https://arxiv.org/abs/2410.19784
ID  - 2410.19784
ER  -