TY  - RPRT
TI  - Measurement-induced entanglement and complexity in random constant-depth 2D quantum circuits
AU  - Max McGinley
AU  - Wen Wei Ho
AU  - Daniel Malz
PY  - 2025
DO  - 10.1103/physrevx.15.021059
UR  - https://arxiv.org/abs/2410.23248
ID  - 2410.23248
ER  -