TY  - RPRT
TI  - Cr/p-HgCdTe (x = 0.28, 1.0) contact resistance and I-V characteristics in the LTLM configuration
AU  - F. Sizov
AU  - A. Zinovchuk
AU  - V. Slipokurov
AU  - Ye. Melezhyk
AU  - Z. Tsybrii
PY  - 2024
UR  - https://arxiv.org/abs/2411.01003
ID  - 2411.01003
ER  -