TY  - RPRT
TI  - High-space-bandwidth product characterization of metalenses with Fourier ptychographic microscopy
AU  - Chuanjian Zheng
AU  - Wenli Wang
AU  - Yanfang Ji
AU  - Yao Hu
AU  - Shaohui Zhang
AU  - Qun Hao
PY  - 2024
UR  - https://arxiv.org/abs/2411.01107
ID  - 2411.01107
ER  -