TY  - RPRT
TI  - Dependence of Electrostatic Patch Force Evaluation on the Lateral Resolution of Kelvin Probe Force Microscopy
AU  - Kun Shi
AU  - Pengshun Luo
AU  - Jinquan Liu
AU  - Hang Yin
AU  - Zebing Zhou
PY  - 2024
DO  - 10.1103/physrevd.110.122007
UR  - https://arxiv.org/abs/2411.01733
ID  - 2411.01733
ER  -