TY  - RPRT
TI  - Si/SiO$_\text{2}$ MOSFET Reliability Physics: From Four-State Model to All-State Model
AU  - Xinjing Guo
AU  - Menglin Huang
AU  - Shiyou Chen
PY  - 2024
UR  - https://arxiv.org/abs/2411.04823
ID  - 2411.04823
ER  -