@misc{indiciae3f79a1e6b052,
  title = {Probing Charge Dynamics in Amorphous Oxide Semiconductors by Time-of-flight Microwave Impedance Microscopy},
  author = {Jia Yu and Yuchen Zhou and Xiao Wang and Xuejian Ma and Ananth Dodabalapur and Keji Lai},
  year = {2024},
  doi = {10.1021/acsaelm.4c01652},
  url = {https://arxiv.org/abs/2411.10698},
  note = {Source identifier: 2411.10698}
}