TY  - RPRT
TI  - Probing Charge Dynamics in Amorphous Oxide Semiconductors by Time-of-flight Microwave Impedance Microscopy
AU  - Jia Yu
AU  - Yuchen Zhou
AU  - Xiao Wang
AU  - Xuejian Ma
AU  - Ananth Dodabalapur
AU  - Keji Lai
PY  - 2024
DO  - 10.1021/acsaelm.4c01652
UR  - https://arxiv.org/abs/2411.10698
ID  - 2411.10698
ER  -