@misc{indiciaeaabd769b3db5,
  title = {Wafer Map Defect Classification Using Autoencoder-Based Data Augmentation and Convolutional Neural Network},
  author = {Yin-Yin Bao and Er-Chao Li and Hong-Qiang Yang and Bin-Bin Jia},
  year = {2024},
  url = {https://arxiv.org/abs/2411.11029},
  note = {Source identifier: 2411.11029}
}