TY  - RPRT
TI  - Wafer Map Defect Classification Using Autoencoder-Based Data Augmentation and Convolutional Neural Network
AU  - Yin-Yin Bao
AU  - Er-Chao Li
AU  - Hong-Qiang Yang
AU  - Bin-Bin Jia
PY  - 2024
UR  - https://arxiv.org/abs/2411.11029
ID  - 2411.11029
ER  -