TY  - RPRT
TI  - Parametric study of filament and gap models of resistive switching in TaO$_x$-based devices
AU  - Rongchen Li
AU  - Yang Bai
AU  - Marek Skowronski
PY  - 2024
UR  - https://arxiv.org/abs/2411.14970
ID  - 2411.14970
ER  -