TY  - RPRT
TI  - An Affordable Experimental Technique for SRAM Write Margin Characterization for Nanometer CMOS Technologies
AU  - Bartomeu Alorda
AU  - Cristian Carmona
AU  - Gabriel Torrens
AU  - Sebastia Bota
PY  - 2024
DO  - 10.1016/j.microrel.2016.07.154
UR  - https://arxiv.org/abs/2411.15521
ID  - 2411.15521
ER  -