@misc{indiciaec05176cd5fe1,
  title = {Electronic Trap Detection with Carrier-Resolved Photo-Hall Effect},
  author = {Oki Gunawan and Chaeyoun Kim and Bonfilio Nainggolan and Minyeul Lee and Jonghwa Shin and Dong Suk Kim and Yimhyun Jo and Minjin Kim and Julie Euvrard and Douglas Bishop and Frank Libsch and Teodor Todorov and Yunna Kim and Byungha Shin},
  year = {2024},
  doi = {10.1126/sciadv.adz0460},
  url = {https://arxiv.org/abs/2411.16092},
  note = {Source identifier: 2411.16092}
}