@misc{indiciaef84b7cfbcc85,
  title = {Background-Aware Defect Generation for Robust Industrial Anomaly Detection},
  author = {Youngjae Cho and Gwangyeol Kim and Sirojbek Safarov and Seongdeok Bang and Jaewoo Park},
  year = {2025},
  url = {https://arxiv.org/abs/2411.16767},
  note = {Source identifier: 2411.16767}
}