TY  - RPRT
TI  - Background-Aware Defect Generation for Robust Industrial Anomaly Detection
AU  - Youngjae Cho
AU  - Gwangyeol Kim
AU  - Sirojbek Safarov
AU  - Seongdeok Bang
AU  - Jaewoo Park
PY  - 2025
UR  - https://arxiv.org/abs/2411.16767
ID  - 2411.16767
ER  -